{"title":"Four Point Probe","description":"\u003cp\u003eA four point probe measures sheet resistance and resistivity: current flows through the two outer probes while the two inner probes measure voltage, removing contact resistance from the result. It is used for conductive films, ITO and FTO glass, semiconductors and coatings.\u003c\/p\u003e\u003ch3\u003eHow to choose\u003c\/h3\u003e\u003cul\u003e\n\u003cli\u003e\n\u003cb\u003eSystem:\u003c\/b\u003e Ossila Four Point Probe Original (T2001A4\/B4) or Plus (T2001A5\/B5).\u003c\/li\u003e\n\u003cli\u003e\n\u003cb\u003eProbe head:\u003c\/b\u003e soft-tipped for delicate thin films, sharp-tipped for harder surfaces, or both; replacement heads P2010A2 and P2010B1.\u003c\/li\u003e\n\u003c\/ul\u003e\u003cp\u003eNeed help choosing a model or a formal quotation (PO, tax invoice)? Contact the AMI Scientific team via WhatsApp.\u003c\/p\u003e","products":[{"product_id":"os240002","title":"Ossila Four Point Probe Original Soft-tipped probe head T2001A4","description":"\u003ch3\u003eDescription\u003c\/h3\u003e\n\u003cp\u003eThe Ossila Four-Point Probe Original with soft-tipped probe head (T2001A4) is a benchtop instrument for characterizing thin films by sheet resistance, resistivity and conductivity. It covers sheet resistances from 100 mΩ\/sq to 10 MΩ\/sq, with currents from 1 μA to 200 mA and voltages from 100 μV to 10 V.\u003c\/p\u003e\n\u003cp\u003eThis configuration uses gold-plated, spring-loaded probes with rounded tips of 0.24 mm radius. As the probes retract into the head on contact, the downward force is spread out and a uniform 60 grams is applied, making the head well suited to organic materials and very thin films. It is not intended for silicon or other materials that naturally grow insulating oxide layers.\u003c\/p\u003e\n\u003cp\u003eThe Original model is operated from a PC using the free Ossila Sheet Resistance Lite software, which calculates geometrical correction factors, resistivity and conductivity, and exports data as .csv files. Positive and negative polarity measurements remove voltage offsets, while micrometer height control and a non-slip stage help achieve good electrical contact.\u003c\/p\u003e\n\u003ch3\u003eLaboratory Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eMeasuring sheet resistance of delicate thin films without damaging the surface.\u003c\/li\u003e\n\u003cli\u003eCharacterizing resistivity and conductivity of organic material layers when sample thickness is known.\u003c\/li\u003e\n\u003cli\u003eEvaluating conductive coatings such as indium tin oxide through sheet resistance measurements.\u003c\/li\u003e\n\u003cli\u003eRoutine electrical characterization of thin-film samples up to 152.4 mm across.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eSpecifications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eBrand: Ossila\u003c\/li\u003e\n\u003cli\u003eProduct code: T2001A4\u003c\/li\u003e\n\u003cli\u003eSheet Resistance Range: 100 mΩ\/sq – 10 MΩ\/sq\u003c\/li\u003e\n\u003cli\u003eApplied Voltage Range: ±10 mV – ±10 V\u003c\/li\u003e\n\u003cli\u003eVoltage Measurement Precision: ±333 μV\u003c\/li\u003e\n\u003cli\u003eCurrent Measurement Ranges: ±20 μA – ±200 mA (5 ranges)\u003c\/li\u003e\n\u003cli\u003eProbe Type: Soft-tipped, gold-plated, spring-loaded\u003c\/li\u003e\n\u003cli\u003eProbe Tip Radius: 0.24 mm\u003c\/li\u003e\n\u003cli\u003eProbe Force: 60 grams\u003c\/li\u003e\n\u003cli\u003eProbe Spacing: 1.27 mm (0.05\")\u003c\/li\u003e\n\u003cli\u003eRectangular Sample Size: Long edge minimum: 5 mm (0.20\"); Short edge maximum: 152.4 mm (6\")\u003c\/li\u003e\n\u003cli\u003eCircular Sample Diameter: 5 mm – 152.4 mm (0.20\" – 6.00\")\u003c\/li\u003e\n\u003cli\u003eMaximum Sample Thickness: 8 mm (0.31\")\u003c\/li\u003e\n\u003cli\u003eDimensions (W x H x D): 145 mm x 150 mm x 240 mm (5.71\" x 5.91\" x 9.45\")\u003c\/li\u003e\n\u003cli\u003eSoftware: Ossila Sheet Resistance Lite\u003c\/li\u003e\n\u003cli\u003eConnectivity: USB 2.0, or Ethernet (requires DHCP)\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eHandling and Storage\u003c\/h3\u003e\n\u003cp\u003eThe gold plating on the soft-tipped probes can degrade in humid environments or with corrosive, abrasive or acidic samples, particularly under electrical load. Gold may also diffuse into materials such as copper, aluminium, tin and silicon, especially at high temperatures caused by resistive heating at high current.\u003c\/p\u003e","brand":"Ossila","offers":[{"title":"Default Title","offer_id":47902078566618,"sku":"OS240002","price":84686000.0,"currency_code":"IDR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0756\/7156\/8602\/files\/four-point-probe-product-photo_380x380_e0871a45-90c1-4a83-913b-2fbd1648a190.jpg?v=1779263411"},{"product_id":"os240057","title":"Ossila Soft-tipped Four Point Probe Head P2010A2","description":"\u003ch3\u003eDescription\u003c\/h3\u003e\n\u003cp\u003eThe Ossila P2010A2 is a soft-tipped replacement probe head for the Ossila Four-Point Probe system. It lets you measure sheet resistance, resistivity and conductivity of samples using the four-point method.\u003c\/p\u003e\n\u003cp\u003eEach of the four probes is gold coated for good electrical contact. The tips are rounded and spring loaded, so they press on the sample with an even force of up to 60 grams instead of digging in the way sharp probes can. This reduces or eliminates surface damage, which makes the head a good fit for delicate films and coatings.\u003c\/p\u003e\n\u003cp\u003eThe probes sit 1.27 mm (0.05\") apart, have a 0.24 mm radius and a 1.4 mm stroke, and are made from a gold- and nickel-plated brass alloy. The head connects through SMA connectors, handles a maximum current of 2 A and has a stated measurement error of ±4%.\u003c\/p\u003e\n\u003ch3\u003eLaboratory Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eMeasuring the sheet resistance of thin films and coated samples with the Ossila Four-Point Probe.\u003c\/li\u003e\n\u003cli\u003eDetermining the resistivity and conductivity of conductive materials.\u003c\/li\u003e\n\u003cli\u003eCharacterising delicate samples where sharp probe tips could scratch or damage the surface.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eSpecifications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eBrand: Ossila\u003c\/li\u003e\n\u003cli\u003eProduct code: P2010A2\u003c\/li\u003e\n\u003cli\u003eProbe Spacing: 1.27 mm (0.05\")\u003c\/li\u003e\n\u003cli\u003eProbe Radius: 0.24 mm\u003c\/li\u003e\n\u003cli\u003eProbe Stroke: 1.4 mm\u003c\/li\u003e\n\u003cli\u003eSpring Force: 25 - 60 grams\u003c\/li\u003e\n\u003cli\u003eMaximum Current: 2 A\u003c\/li\u003e\n\u003cli\u003eMeasurement Error: ±4%\u003c\/li\u003e\n\u003cli\u003eProbe Material: Gold- and nickel-plated brass alloy\u003c\/li\u003e\n\u003cli\u003eConnections: SMA\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eHandling and Storage\u003c\/h3\u003e\n\u003cp\u003eThe gold plating can wear in humid conditions or on corrosive, abrasive or acidic samples, especially while current is flowing. Gold can also diffuse into materials such as copper, aluminium, tin and silicon at high temperatures, which resistive heating at high current can cause, so keep these conditions in mind when choosing samples and current levels.\u003c\/p\u003e","brand":"Ossila","offers":[{"title":"Default Title","offer_id":47902080598234,"sku":"OS240057","price":7473000.0,"currency_code":"IDR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0756\/7156\/8602\/files\/four-point-probe-soft-point-head-product-photo_380x380_3a3e7426-6041-451b-83a1-b17db2406e9a.jpg?v=1779265727"},{"product_id":"os240058","title":"Ossila Sharp-tipped Four Point Probe Head P2010B1","description":"\u003ch3\u003eDescription\u003c\/h3\u003e\n\u003cp\u003eThe Ossila P2010B1 is the sharp-tipped probe head for the Ossila Four-Point Probe. It is used to measure sheet resistance, resistivity and conductivity, and is intended for materials that naturally grow an oxide layer on their surface.\u003c\/p\u003e\n\u003cp\u003eIts probes are made from nickel-plated tungsten carbide and end in tips 0.08 mm in diameter. At maximum travel they press with a force of 197.43 gf, enough to break through the insulating oxide and make dependable contact with the material underneath. The probes are spaced 1.6 mm (0.063\") apart, have a stroke of 1.19 mm and a spring constant of 159.22 gf\/mm. The head connects to the instrument through SMA connectors.\u003c\/p\u003e\n\u003cp\u003eTo use this head, the Ossila Four-Point Probe must run screen firmware version 1.1.0 or newer, which is available for download from Ossila.\u003c\/p\u003e\n\u003ch3\u003eLaboratory Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eMeasuring sheet resistance of samples with a naturally forming oxide layer.\u003c\/li\u003e\n\u003cli\u003eDetermining the resistivity of materials using the Ossila Four-Point Probe.\u003c\/li\u003e\n\u003cli\u003eMeasuring the conductivity of materials whose surface oxide must be pierced for reliable contact.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eSpecifications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eBrand: Ossila\u003c\/li\u003e\n\u003cli\u003eProduct code: P2010B1\u003c\/li\u003e\n\u003cli\u003eProbe Spacing: 1.6 mm (0.063\")\u003c\/li\u003e\n\u003cli\u003eProbe Tip Diameter: 0.08 mm\u003c\/li\u003e\n\u003cli\u003eProbe Stroke: 1.19 mm\u003c\/li\u003e\n\u003cli\u003eForce at Maximum Travel: 197.43 gf\u003c\/li\u003e\n\u003cli\u003eSpring Constant: 159.22 gf\/mm\u003c\/li\u003e\n\u003cli\u003eProbe Material: Nickel-plated tungsten carbide\u003c\/li\u003e\n\u003cli\u003eConnections: SMA\u003c\/li\u003e\n\u003cli\u003eRequired Firmware: Screen firmware version 1.1.0 or newer\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eHandling and Storage\u003c\/h3\u003e\n\u003cp\u003eDo not exceed the maximum probe stroke of 1.19 mm, as this may damage or destroy the substrate.\u003c\/p\u003e","brand":"Ossila","offers":[{"title":"Default Title","offer_id":47902080631002,"sku":"OS240058","price":24908000.0,"currency_code":"IDR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0756\/7156\/8602\/files\/four-point-probe-hard-point-head-product-photo_380x380_6916824b-dc71-4727-a6c3-2ec0f36bc2a0.jpg?v=1779265749"},{"product_id":"os240136","title":"Ossila Four Point Probe Original Sharp-tipped probe head T2001B4","description":"\u003ch3\u003eDescription\u003c\/h3\u003e\n\u003cp\u003eThe Ossila Four-Point Probe Original (T2001B4) with a sharp-tipped probe head is a bench system for measuring sheet resistance, resistivity and conductivity of thin films within seconds. It covers sheet resistances from 100 mΩ\/sq to 10 MΩ\/sq, with currents from 1 μA to 200 mA and voltages from 100 μV to 10 V.\u003c\/p\u003e\n\u003cp\u003eThe sharp-tipped head suits hard materials that naturally grow insulating oxide layers, such as silicon. Its nickel-plated tungsten carbide probes have a tip diameter of 0.08 mm and can apply a maximum force of 197.43 gf, breaking through the oxide to contact the material directly. Probe spacing is 1.6 mm (0.063\").\u003c\/p\u003e\n\u003cp\u003eThe Original model is operated from a PC using the free Ossila Sheet Resistance Lite software, which calculates geometrical correction factors, derives resistivity and conductivity from sample dimensions and exports data as .csv files. Positive and negative polarity measurements remove voltage offsets, while micrometer height control and a non-slip stage help achieve good electrical contact every time.\u003c\/p\u003e\n\u003ch3\u003eLaboratory Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eSheet resistance measurement of silicon and other materials with native insulating oxide layers.\u003c\/li\u003e\n\u003cli\u003eResistivity and conductivity characterization of thin films using entered sample thickness.\u003c\/li\u003e\n\u003cli\u003eEvaluation of conductive coatings such as indium tin oxide through sheet resistance measurement.\u003c\/li\u003e\n\u003cli\u003eRoutine electrical characterization of circular or rectangular samples up to 152.4 mm.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eSpecifications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eBrand: Ossila\u003c\/li\u003e\n\u003cli\u003eProduct code: T2001B4\u003c\/li\u003e\n\u003cli\u003eProbe type: Sharp-tipped, nickel-plated tungsten carbide\u003c\/li\u003e\n\u003cli\u003eTip diameter: 0.08 mm\u003c\/li\u003e\n\u003cli\u003eMaximum probe force: 197.43 gf\u003c\/li\u003e\n\u003cli\u003eProbe spacing: 1.6 mm (0.063\")\u003c\/li\u003e\n\u003cli\u003eSheet resistance range: 100 mΩ\/sq – 10 MΩ\/sq\u003c\/li\u003e\n\u003cli\u003eApplied voltage range: ±10 mV – ±10 V\u003c\/li\u003e\n\u003cli\u003eVoltage measurement precision: ±333 μV\u003c\/li\u003e\n\u003cli\u003eCurrent measurement ranges: ±20 μA – ±200 mA (5 ranges)\u003c\/li\u003e\n\u003cli\u003eRectangular sample size: Long edge minimum: 6 mm (0.24\"); Short edge maximum: 152.4 mm (6\")\u003c\/li\u003e\n\u003cli\u003eCircular sample diameter: 6 mm – 152.4 mm (0.24\" – 6.00\")\u003c\/li\u003e\n\u003cli\u003eMaximum sample thickness: 5 mm (0.2\")\u003c\/li\u003e\n\u003cli\u003eDimensions (W x H x D): 145 mm x 150 mm x 240 mm (5.71\" x 5.91\" x 9.45\")\u003c\/li\u003e\n\u003cli\u003eSoftware: Ossila Sheet Resistance Lite (Windows 11, 64-bit)\u003c\/li\u003e\n\u003cli\u003eConnectivity: USB 2.0, or Ethernet (requires DHCP)\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eHandling and Storage\u003c\/h3\u003e\n\u003cp\u003eUse of the sharp-tipped probe head requires screen firmware version 1.1.0 or newer on the instrument. The probe head can add up to 4% additional measurement error, which should be considered when evaluating results.\u003c\/p\u003e","brand":"Ossila","offers":[{"title":"Default Title","offer_id":47902084137178,"sku":"OS240136","price":99630000.0,"currency_code":"IDR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0756\/7156\/8602\/files\/four-point-probe-product-photo_380x380_32f8e4ba-e7c9-4b1a-b8f6-9141ab54ba28.jpg?v=1779344850"},{"product_id":"os240137","title":"Ossila Four Point Probe Original Both probe head T2001A4-P2010B1","description":"\u003ch3\u003eDescription\u003c\/h3\u003e\n\u003cp\u003eThe Ossila Four-Point Probe Original (T2001A4-P2010B1) is a bench system for measuring the sheet resistance, resistivity and conductivity of thin films. This configuration comes with both probe heads, one soft-tipped and one sharp-tipped, so a single instrument can handle delicate coatings as well as hard materials such as silicon. The Original model is operated from a PC running the free Ossila Sheet Resistance Lite software.\u003c\/p\u003e\n\u003cp\u003eThe soft-tipped head uses rounded, spring-loaded, gold-plated contacts that apply a uniform 60 grams of force, which suits organic materials and very thin films. The sharp-tipped head has nickel-plated tungsten carbide probes that break through native insulating oxide layers with a maximum force of 197.43 gf. Switching between the heads lets you match the contact to each sample.\u003c\/p\u003e\n\u003cp\u003eThe system covers sheet resistances from 100 mΩ\/sq to 10 MΩ\/sq. Positive and negative polarity measurements remove voltage offsets, while micrometer height control and a non-slip stage help achieve good electrical contact. The software calculates geometrical correction factors and saves results as .csv files for further analysis.\u003c\/p\u003e\n\u003ch3\u003eLaboratory Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eMeasuring the sheet resistance of thin-film coatings such as indium tin oxide.\u003c\/li\u003e\n\u003cli\u003eCharacterising delicate organic films or very thin layers with the soft-tipped probe head.\u003c\/li\u003e\n\u003cli\u003eTesting silicon and other materials with native oxide layers using the sharp-tipped probe head.\u003c\/li\u003e\n\u003cli\u003eCalculating resistivity and conductivity of samples from sheet resistance and entered thickness.\u003c\/li\u003e\n\u003cli\u003eLogging measurement data to .csv files for import into analysis software.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eSpecifications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eBrand: Ossila\u003c\/li\u003e\n\u003cli\u003eProduct code: T2001A4-P2010B1\u003c\/li\u003e\n\u003cli\u003eSheet Resistance Range: 100 mΩ\/sq – 10 MΩ\/sq\u003c\/li\u003e\n\u003cli\u003eApplied Voltage Range: ±10 mV – ±10 V\u003c\/li\u003e\n\u003cli\u003eVoltage Measurement Precision: ±333 μV\u003c\/li\u003e\n\u003cli\u003eCurrent Measurement Ranges: ±20 μA – ±200 mA (5 ranges)\u003c\/li\u003e\n\u003cli\u003eDimensions (W x H x D): 145 mm x 150 mm x 240 mm\u003c\/li\u003e\n\u003cli\u003eProbe Heads Included: 1 x Soft-tipped probe head \u0026amp; 1 x Sharp-tipped probe head\u003c\/li\u003e\n\u003cli\u003eSoft-Tipped Probes: Rounded, spring-loaded, gold-plated; 0.24 mm radius; 60 grams force\u003c\/li\u003e\n\u003cli\u003eSharp-Tipped Probes: Nickel-plated tungsten carbide; 0.08 mm tip diameter; max force 197.43 gf\u003c\/li\u003e\n\u003cli\u003eProbe Spacing (Soft \/ Sharp): 1.27 mm \/ 1.6 mm\u003c\/li\u003e\n\u003cli\u003eCircular Sample Diameter (Soft \/ Sharp): 5 mm – 152.4 mm \/ 6 mm – 152.4 mm\u003c\/li\u003e\n\u003cli\u003eMaximum Sample Thickness (Soft \/ Sharp): 8 mm \/ 5 mm\u003c\/li\u003e\n\u003cli\u003eSoftware: Ossila Sheet Resistance Lite (Windows 11, 64-bit)\u003c\/li\u003e\n\u003cli\u003eConnectivity: USB 2.0, or Ethernet (requires DHCP)\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eHandling and Storage\u003c\/h3\u003e\n\u003cp\u003eThe gold plating on the soft-tipped probes can degrade in humid environments or with corrosive, abrasive or acidic samples, particularly under electrical load. Gold may also diffuse into copper, aluminium, tin and silicon, especially at high temperatures caused by resistive heating at high current. Use the sharp-tipped head for silicon and other oxide-forming materials.\u003c\/p\u003e","brand":"Ossila","offers":[{"title":"Default Title","offer_id":47902084169946,"sku":"OS240137","price":104612000.0,"currency_code":"IDR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0756\/7156\/8602\/files\/four-point-probe-product-photo_380x380_32f8e4ba-e7c9-4b1a-b8f6-9141ab54ba28.jpg?v=1779344850"},{"product_id":"os240138","title":"Ossila Four Point Probe Plus Soft-tipped probe head T2001A5","description":"\u003ch3\u003eDescription\u003c\/h3\u003e\n\u003cp\u003eThe Ossila Four-Point Probe Plus (T2001A5) is a benchtop system for measuring the sheet resistance, resistivity and conductivity of thin films within seconds. This configuration comes with the soft-tipped probe head, intended for delicate samples such as organic materials and very thin films.\u003c\/p\u003e\n\u003cp\u003eThe gold-plated probes have rounded tips with a radius of 0.24 mm and sit on springs, retracting into the head on contact so that a uniform force of 60 grams is applied without damaging the surface. The soft-tipped probes are not suited to silicon or other materials that naturally form insulating oxide layers. The system covers sheet resistances from 100 mΩ\/sq to 10 MΩ\/sq, with currents from 1 μA to 200 mA and voltages from 100 μV to 10 V.\u003c\/p\u003e\n\u003cp\u003eThe Plus model has a built-in display, so measurements can be taken at the press of a button without a PC, which makes it practical inside a glove box. It can also be run from a PC with the free Ossila Sheet Resistance Lite software, which saves data as .csv files. Positive and negative polarity measurements remove voltage offsets, while micrometer height control and a non-slip stage help achieve consistent electrical contact.\u003c\/p\u003e\n\u003ch3\u003eLaboratory Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eSheet resistance measurement of delicate thin films and organic materials.\u003c\/li\u003e\n\u003cli\u003eCalculation of resistivity and conductivity from sheet resistance and entered sample dimensions.\u003c\/li\u003e\n\u003cli\u003eStand-alone thin-film characterization inside a glove box using the built-in display.\u003c\/li\u003e\n\u003cli\u003eInvestigating changes in conductive coatings such as indium tin oxide through sheet resistance measurements.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eSpecifications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eBrand: Ossila\u003c\/li\u003e\n\u003cli\u003eProduct code: T2001A5\u003c\/li\u003e\n\u003cli\u003eSheet Resistance Range: 100 mΩ\/sq – 10 MΩ\/sq\u003c\/li\u003e\n\u003cli\u003eApplied Voltage Range: ±10 mV – ±10 V\u003c\/li\u003e\n\u003cli\u003eVoltage Measurement Precision: ±333 μV\u003c\/li\u003e\n\u003cli\u003eCurrent Measurement Ranges: ±20 μA – ±200 mA (5 ranges)\u003c\/li\u003e\n\u003cli\u003eProbe Type: Soft-tipped, gold-plated, spring-loaded\u003c\/li\u003e\n\u003cli\u003eProbe Tip Radius: 0.24 mm\u003c\/li\u003e\n\u003cli\u003eProbe Force: 60 grams\u003c\/li\u003e\n\u003cli\u003eProbe Spacing: 1.27 mm (0.05\")\u003c\/li\u003e\n\u003cli\u003eRectangular Sample Size: Long edge minimum: 5 mm (0.20\"); Short edge maximum: 152.4 mm (6\")\u003c\/li\u003e\n\u003cli\u003eCircular Sample Diameter: 5 mm – 152.4 mm (0.20\" – 6.00\")\u003c\/li\u003e\n\u003cli\u003eMaximum Sample Thickness: 8 mm (0.31\")\u003c\/li\u003e\n\u003cli\u003eDimensions (W x H x D): 145 mm x 150 mm x 240 mm (5.71\" x 5.91\" x 9.45\")\u003c\/li\u003e\n\u003cli\u003eSoftware: Ossila Sheet Resistance Lite (Windows 11, 64-bit)\u003c\/li\u003e\n\u003cli\u003eConnectivity: USB 2.0, or Ethernet (requires DHCP)\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eHandling and Storage\u003c\/h3\u003e\n\u003cp\u003eThe gold plating on the soft-tipped probes can degrade in humid environments or with corrosive, abrasive or acidic samples, particularly under electrical load. Gold may also diffuse into materials such as copper, aluminium, tin and silicon, especially at high temperatures caused by resistive heating at high current.\u003c\/p\u003e","brand":"Ossila","offers":[{"title":"Default Title","offer_id":47902084202714,"sku":"OS240138","price":104612000.0,"currency_code":"IDR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0756\/7156\/8602\/files\/Four-Point-Probe-Focus-Stack-Product-Image_380x380_e8e30ecb-2595-4fd6-b1a8-8e1f88d0d236.jpg?v=1779344934"},{"product_id":"os240139","title":"Ossila Four Point Probe Plus Sharp-tipped probe head T2001B5","description":"\u003ch3\u003eDescription\u003c\/h3\u003e\n\u003cp\u003eThe Ossila Four-Point Probe Plus (T2001B5) is a benchtop system for measuring the sheet resistance, resistivity and conductivity of thin films. This configuration is fitted with the sharp-tipped probe head, intended for hard materials such as silicon that naturally develop an insulating oxide layer. Its nickel-plated tungsten carbide probes, with a 0.08 mm tip diameter, can apply up to 197.43 gf to break through that layer and contact the material directly.\u003c\/p\u003e\n\u003cp\u003eThe Plus model has a built-in display, so readings can be taken at the press of a button without a PC, which suits work inside a glove box. It can also be run from a computer with the free Ossila Sheet Resistance Lite software, which saves data as .csv files and calculates geometrical correction factors.\u003c\/p\u003e\n\u003cp\u003eThe system covers sheet resistances from 100 mΩ\/sq to 10 MΩ\/sq. Positive and negative polarity measurements remove voltage offsets, while micrometer height control and a non-slip stage help achieve good electrical contact each time.\u003c\/p\u003e\n\u003ch3\u003eLaboratory Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eSheet resistance measurement of silicon and other materials with native insulating oxide layers.\u003c\/li\u003e\n\u003cli\u003eResistivity and conductivity characterization of thin films when sample thickness is entered.\u003c\/li\u003e\n\u003cli\u003eStandalone measurements inside a glove box using the built-in display.\u003c\/li\u003e\n\u003cli\u003eCharacterization of conductive coatings such as indium tin oxide.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eSpecifications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eBrand: Ossila\u003c\/li\u003e\n\u003cli\u003eProduct code: T2001B5\u003c\/li\u003e\n\u003cli\u003eProbe type: Sharp-tipped, nickel-plated tungsten carbide\u003c\/li\u003e\n\u003cli\u003eTip diameter: 0.08 mm\u003c\/li\u003e\n\u003cli\u003eMaximum probe force: 197.43 gf\u003c\/li\u003e\n\u003cli\u003eProbe spacing: 1.6 mm (0.063\")\u003c\/li\u003e\n\u003cli\u003eSheet resistance range: 100 mΩ\/sq – 10 MΩ\/sq\u003c\/li\u003e\n\u003cli\u003eApplied voltage range: ±10 mV – ±10 V\u003c\/li\u003e\n\u003cli\u003eVoltage measurement precision: ±333 μV\u003c\/li\u003e\n\u003cli\u003eCurrent measurement ranges: ±20 μA – ±200 mA (5 ranges)\u003c\/li\u003e\n\u003cli\u003eRectangular sample size: Long edge minimum: 6 mm (0.24\"); Short edge maximum: 152.4 mm (6\")\u003c\/li\u003e\n\u003cli\u003eCircular sample diameter: 6 mm – 152.4 mm (0.24\" – 6.00\")\u003c\/li\u003e\n\u003cli\u003eMaximum sample thickness: 5 mm (0.2\")\u003c\/li\u003e\n\u003cli\u003eDimensions (W x H x D): 145 mm x 150 mm x 240 mm\u003c\/li\u003e\n\u003cli\u003eRequired screen firmware: Version 1.1.0 or newer\u003c\/li\u003e\n\u003cli\u003eConnectivity: USB 2.0, or Ethernet (requires DHCP)\u003c\/li\u003e\n\u003c\/ul\u003e","brand":"Ossila","offers":[{"title":"Default Title","offer_id":47902084235482,"sku":"OS240139","price":119556000.0,"currency_code":"IDR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0756\/7156\/8602\/files\/Four-Point-Probe-Focus-Stack-Product-Image_380x380_e8e30ecb-2595-4fd6-b1a8-8e1f88d0d236.jpg?v=1779344934"},{"product_id":"os240140","title":"Ossila Four Point Probe Plus Both probe head T2001A5-P2010B1","description":"\u003ch3\u003eDescription\u003c\/h3\u003e\n\u003cp\u003eThe Ossila Four-Point Probe Plus is a benchtop instrument for determining the sheet resistance, resistivity and conductivity of thin films within seconds. This configuration ships with two interchangeable probe heads, one soft-tipped and one sharp-tipped, so a single system can handle both delicate and hard samples across a sheet resistance range of 100 mΩ\/sq to 10 MΩ\/sq.\u003c\/p\u003e\n\u003cp\u003eThe soft-tipped head uses rounded, gold-plated, spring-loaded pins that apply a uniform 60 grams of force, protecting organic materials and very thin films. The sharp-tipped head uses nickel-plated tungsten carbide pins that can apply up to 197.43 gf to break through native oxide layers on materials such as silicon.\u003c\/p\u003e\n\u003cp\u003eThe Plus model has a built-in display, letting users measure at the press of a button without a PC, which suits glove box work. It can also be run from a PC with the free Ossila Sheet Resistance Lite software, which exports .csv data and calculates geometric correction factors. Positive and negative polarity measurements, micrometer height control and a non-slip stage support accurate, repeatable contact.\u003c\/p\u003e\n\u003ch3\u003eLaboratory Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eMeasuring sheet resistance of thin films from 100 mΩ\/sq to 10 MΩ\/sq.\u003c\/li\u003e\n\u003cli\u003eCharacterizing delicate organic or very thin films with the soft-tipped probe head.\u003c\/li\u003e\n\u003cli\u003eMeasuring silicon and other materials with insulating oxide layers using the sharp-tipped probe head.\u003c\/li\u003e\n\u003cli\u003eStandalone measurements inside a glove box using the built-in display.\u003c\/li\u003e\n\u003cli\u003eCalculating resistivity and conductivity of coatings from sheet resistance and sample thickness.\u003c\/li\u003e\n\u003cli\u003eStudying sheet resistance changes in coatings such as indium tin oxide.\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eSpecifications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eBrand: Ossila\u003c\/li\u003e\n\u003cli\u003eProduct code: T2001A5-P2010B1\u003c\/li\u003e\n\u003cli\u003eSheet Resistance Range: 100 mΩ\/sq – 10 MΩ\/sq\u003c\/li\u003e\n\u003cli\u003eApplied Voltage Range: ±10 mV – ±10 V\u003c\/li\u003e\n\u003cli\u003eVoltage Measurement Precision: ±333 μV\u003c\/li\u003e\n\u003cli\u003eCurrent Measurement Ranges: ±20 μA – ±200 mA (5 ranges)\u003c\/li\u003e\n\u003cli\u003eDimensions (W x H x D): 145 mm x 150 mm x 240 mm\u003c\/li\u003e\n\u003cli\u003eIncluded Probe Heads: 1 x Soft-tipped probe head \u0026amp; 1 x Sharp-tipped probe head\u003c\/li\u003e\n\u003cli\u003eSoft-tipped Probes: Rounded, gold-plated, spring-loaded; 60 grams force; tip radius 0.24 mm\u003c\/li\u003e\n\u003cli\u003eSharp-tipped Probes: Nickel-plated tungsten carbide; max force 197.43 gf; tip diameter 0.08 mm\u003c\/li\u003e\n\u003cli\u003eProbe Spacing (soft \/ sharp): 1.27 mm \/ 1.6 mm\u003c\/li\u003e\n\u003cli\u003eCircular Sample Diameter (soft \/ sharp): 5 mm – 152.4 mm \/ 6 mm – 152.4 mm\u003c\/li\u003e\n\u003cli\u003eMaximum Sample Thickness (soft \/ sharp): 8 mm \/ 5 mm\u003c\/li\u003e\n\u003cli\u003eSoftware: Ossila Sheet Resistance Lite (Windows 11, 64-bit)\u003c\/li\u003e\n\u003cli\u003eConnectivity: USB 2.0, or Ethernet (requires DHCP)\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003ch3\u003eHandling and Storage\u003c\/h3\u003e\n\u003cp\u003eThe gold plating on the soft-tipped probes can degrade in humid environments or with corrosive, abrasive or acidic samples, especially under electrical load. Gold may also diffuse into copper, aluminium, tin and silicon, particularly at high temperatures caused by resistive heating at high current. Soft-tipped probes are not suitable for silicon or other materials that form insulating oxide layers. The sharp-tipped head requires screen firmware version 1.1.0 or newer.\u003c\/p\u003e","brand":"Ossila","offers":[{"title":"Default Title","offer_id":47902084268250,"sku":"OS240140","price":124538000.0,"currency_code":"IDR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0756\/7156\/8602\/files\/Four-Point-Probe-Focus-Stack-Product-Image_380x380_e8e30ecb-2595-4fd6-b1a8-8e1f88d0d236.jpg?v=1779344934"}],"url":"https:\/\/amiscientific.com\/en\/collections\/four-point-probe.oembed","provider":"AMI Scientific","version":"1.0","type":"link"}