• Sistem Probe Ossila T2001A4 (System Four Point Probe Original Soft-Tipped Head) - AMI Scientific
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Ossila

Ossila Four Point Probe Original Soft-tipped probe head T2001A4

Ossila Four Point Probe Original Soft-tipped probe head T2001A4
Rp 88.920.300,00
Rp 88.920.300,00
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The Ossila Four-Point Probe Original with soft-tipped probe head (T2001A4) is a benchtop instrument for characterizing thin films by sheet resistance, resistivity and conductivity. It covers sheet resistances from 100 mΩ/sq to 10 MΩ/sq, with currents from 1 μA to 200 mA and voltages from 100 μV to 10 V.

This configuration uses gold-plated, spring-loaded probes with rounded tips of 0.24 mm radius. As the probes retract into the head on contact, the downward force is spread out and a uniform 60 grams is applied, making the head well suited to organic materials and very thin films. It is not intended for silicon or other materials that naturally grow insulating oxide layers.

The Original model is operated from a PC using the free Ossila Sheet Resistance Lite software, which calculates geometrical correction factors, resistivity and conductivity, and exports data as .csv files. Positive and negative polarity measurements remove voltage offsets, while micrometer height control and a non-slip stage help achieve good electrical contact.

Related products

  • Measuring sheet resistance of delicate thin films without damaging the surface.
  • Characterizing resistivity and conductivity of organic material layers when sample thickness is known.
  • Evaluating conductive coatings such as indium tin oxide through sheet resistance measurements.
  • Routine electrical characterization of thin-film samples up to 152.4 mm across.

Brand Ossila
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  • Product code: T2001A4
  • Sheet Resistance Range: 100 mΩ/sq – 10 MΩ/sq
  • Applied Voltage Range: ±10 mV – ±10 V
  • Voltage Measurement Precision: ±333 μV
  • Current Measurement Ranges: ±20 μA – ±200 mA (5 ranges)
  • Probe Type: Soft-tipped, gold-plated, spring-loaded
  • Probe Tip Radius: 0.24 mm
  • Probe Force: 60 grams
  • Probe Spacing: 1.27 mm (0.05")
  • Rectangular Sample Size: Long edge minimum: 5 mm (0.20"); Short edge maximum: 152.4 mm (6")
  • Circular Sample Diameter: 5 mm – 152.4 mm (0.20" – 6.00")
  • Maximum Sample Thickness: 8 mm (0.31")
  • Dimensions (W x H x D): 145 mm x 150 mm x 240 mm (5.71" x 5.91" x 9.45")
  • Software: Ossila Sheet Resistance Lite
  • Connectivity: USB 2.0, or Ethernet (requires DHCP)

The gold plating on the soft-tipped probes can degrade in humid environments or with corrosive, abrasive or acidic samples, particularly under electrical load. Gold may also diffuse into materials such as copper, aluminium, tin and silicon, especially at high temperatures caused by resistive heating at high current.

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