• Sistem Probe Ossila P2010A2 (System Soft-Tipped Four Point Probe Head) - AMI Scientific
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Ossila

Ossila Soft-tipped Four Point Probe Head P2010A2

Ossila Soft-tipped Four Point Probe Head P2010A2
Rp 7.846.650,00
Rp 7.846.650,00
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The Ossila P2010A2 is a soft-tipped replacement probe head for the Ossila Four-Point Probe system. It lets you measure sheet resistance, resistivity and conductivity of samples using the four-point method.

Each of the four probes is gold coated for good electrical contact. The tips are rounded and spring loaded, so they press on the sample with an even force of up to 60 grams instead of digging in the way sharp probes can. This reduces or eliminates surface damage, which makes the head a good fit for delicate films and coatings.

The probes sit 1.27 mm (0.05") apart, have a 0.24 mm radius and a 1.4 mm stroke, and are made from a gold- and nickel-plated brass alloy. The head connects through SMA connectors, handles a maximum current of 2 A and has a stated measurement error of ±4%.

Related products

  • Measuring the sheet resistance of thin films and coated samples with the Ossila Four-Point Probe.
  • Determining the resistivity and conductivity of conductive materials.
  • Characterising delicate samples where sharp probe tips could scratch or damage the surface.

Brand Ossila
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  • Product code: P2010A2
  • Probe Spacing: 1.27 mm (0.05")
  • Probe Radius: 0.24 mm
  • Probe Stroke: 1.4 mm
  • Spring Force: 25 - 60 grams
  • Maximum Current: 2 A
  • Measurement Error: ±4%
  • Probe Material: Gold- and nickel-plated brass alloy
  • Connections: SMA

The gold plating can wear in humid conditions or on corrosive, abrasive or acidic samples, especially while current is flowing. Gold can also diffuse into materials such as copper, aluminium, tin and silicon at high temperatures, which resistive heating at high current can cause, so keep these conditions in mind when choosing samples and current levels.

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