• Sistem Probe Ossila T2009B1 (System Manual Probe Station) - AMI Scientific
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Ossila

Ossila Manual Probe Station T2009B1

Ossila Manual Probe Station T2009B1
Rp 207.131.400,00
Rp 207.131.400,00
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The Ossila Manual Probe Station T2009B1 is a compact, ready-to-use system for manual electrical probing in small-scale electronics research. It suits routine tasks such as I-V and C-V measurements and testing individual devices or components, while remaining open to customisation.

Samples between 5 mm and 150 mm in diameter are held on an aluminium vacuum chuck with six selectable vacuum zones. The chuck is flat, grounded and electrically isolated, and the whole station sits on elastomeric vibration dampening mounts to keep measurements low-noise and repeatable. A monocular zoom microscope with a Sony IMX415 4K camera streams up to 60 fps over USB 3.0 and HDMI to a 15.6" 1080p monitor on a positionable arm.

The aluminium optical breadboard base with 25 mm hole spacing lets users mount extra hardware, and the ferromagnetic stainless steel platens take up to eight Ossila micromanipulators. A swing-away microscope mount gives clear access to the stage for setup and quick sample changes. The chuck connects to compatible vacuum systems, including the Ossila Diaphragm Vacuum Pump.

Related products

  • Current-voltage (I-V) characterisation of devices and components.
  • Capacitance-voltage (C-V) measurements on small samples.
  • Electrical testing of individual electronic devices on substrates from 5 mm to 150 mm.
  • Semiconductor characterisation in research laboratories.
  • Customised probing setups built on the optical breadboard base.

Brand Ossila
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  • Product code: T2009B1
  • Footprint: (L x W x H) 50 x 35 x 60 cm
  • Base: Aluminum optical breadboard, 25 mm hole spacing
  • Vibration isolation: Elastomeric vibration dampening mounts
  • Maximum supported load: 880 N total
  • Platen capacity: Up to 8 Ossila Micromanipulators
  • Stage travel: 25 mm (X, Y), 10 mm (Z), 360° (coarse rotation), 15° (fine rotation)
  • Stage resolution: 0.01 mm (X, Y, Z), 0.1° (rotation)
  • Substrate size: 5 mm – 150 mm diameter
  • Chuck: Aluminum, 155 mm, vacuum (selectable zones)
  • Chuck isolation: >99 MΩ at 500 VDC
  • Chuck leakage current: <75 pA at ± 75 VDC
  • Microscope: Monocular Zoom Lens (0.6x – 5.0x optical zoom)
  • Camera sensor: Sony IMX415 (4K, 1/2.8")
  • Total magnification: 37x – 309x
  • Probe type: Tungsten, 20 μm tip diameter

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