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Ossila

Ossila Manual Probe Station With two micromanipulators T2009C1

Ossila Manual Probe Station With two micromanipulators T2009C1
Regular price Rp 272.513.850,00
Regular price Sale price Rp 272.513.850,00
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The Ossila Manual Probe Station (T2009C1) is a compact bench system for stable manual electrical probing, aimed mainly at small-scale electronics work such as I-V and C-V measurements and testing of individual devices or components. This configuration includes two micromanipulators, offered with either 10 µm micrometer readout (approx. 4-8 µm smallest motion) or 5 µm readout (approx. 2-4 µm smallest motion).

Samples from 5 mm to 150 mm diameter sit on a grounded, flat aluminium vacuum chuck with six selectable vacuum zones. Elastomeric mounts damp vibration, and the chuck is electrically isolated for low-noise measurements. A monocular zoom microscope with a 4K Sony sensor streams live video at up to 60 fps over USB 3.0 or HDMI to a 15.6" monitor on a positionable arm, and a swing-away mount keeps the stage clear for sample changes.

The aluminium optical breadboard base with 25 mm hole spacing and ferromagnetic stainless steel platens let the setup grow: the platens accept up to eight Ossila micromanipulators, and extra components can be mounted for more specialised experiments. The chuck connects to compatible vacuum pumps, including the Ossila Diaphragm Vacuum Pump.

  • Current-voltage (I-V) characterisation of electronic devices.
  • Capacitance-voltage (C-V) measurements on samples and components.
  • Electrical testing of individual devices and components on substrates up to 150 mm.
  • Semiconductor characterisation in research laboratories.
  • Custom probing experiments built on the optical breadboard base.

Brand Ossila
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  • Product code: T2009C1
  • Footprint (L x W x H): 50 x 35 x 60 cm
  • Base: Aluminum optical breadboard, 25 mm hole spacing
  • Vibration isolation: Elastomeric vibration dampening mounts
  • Platen capacity: Up to 8 Ossila Micromanipulators
  • Stage travel: 25 mm (X, Y), 10 mm (Z), 360° (coarse rotation), 15° (fine rotation)
  • Substrate size: 5 mm – 150 mm diameter
  • Chuck: Aluminum, 155 mm, vacuum (selectable zones)
  • Chuck isolation: >99 MΩ at 500 VDC
  • Chuck leakage current: <75 pA at ± 75 VDC
  • Microscope: Monocular Zoom Lens (0.6x – 5.0x optical zoom)
  • Camera sensor: Sony IMX415 (4K, 1/2.8")
  • Live output: USB 3.0 & HDMI (up to 60 fps at full resolution)
  • Total magnification: 37x – 309x
  • Micromanipulator readout / smallest motion: 10 μm / approx. 4-8 µm; 5 µm / approx. 2-4 µm
  • Probe: Tungsten, 20 μm tip diameter, SMA connection

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