Ossila

Ossila Electrical Characterization System (10 µm readout / 4-8 µm minimum fine motion) T2009E1

Name: Ossila Electrical Characterization System (10 µm readout / 4-8 µm minimum fine motion) T2009E1
Brand: Ossila
SKU: OS240070
Price: 447737850.0 IDR
Availability: InStock

Rp 447.737.850,00

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The Ossila Electrical Characterization System (T2009E1) is a complete manual probe station paired with a dual channel source measure unit (SMU), built for I-V testing of small-scale electronic devices such as photovoltaics, LEDs, OLEDs and transistors. This version uses micromanipulators with a 10 µm micrometer readout and a smallest achievable motion of approx. 4-8 µm.

The station sits on an aluminum optical breadboard with elastomeric vibration dampening mounts and ferromagnetic stainless steel platens that hold up to 8 Ossila Micromanipulators. A vacuum chuck with selectable zones accepts substrates from 5 mm to 150 mm diameter, held by an oil-free diaphragm pump with an integrated pressure gauge. Samples are viewed through a monocular zoom lens (0.6x – 5.0x) with a Sony IMX415 4K camera, delivering up to 60 fps to a 15.6" 1080p monitor on a positionable arm.

The SMU combines two source measure channels, two precision voltage sense channels and a shutter/trigger channel on one board. It covers -10 V to +10 V across five current ranges, from 10 nA up to 200 mA, with 10 speed/resolution settings and free measurement software.

Related products

Measuring I-V characteristics of photovoltaic devices.
Characterizing LEDs and OLEDs on substrates up to 150 mm diameter.
Testing transistors and other DC semiconductor devices with low-leakage tungsten probes.
Synchronizing measurements with other instruments through the shutter/trigger channel.

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Product code: T2009E1
Footprint (L x W x H): 50 x 35 x 60 cm
Micrometer Readout Resolution: 10 μm
Smallest Achievable Motion: Approx. 4-8 µm
Micrometer Head Thread Pitch: 50 threads per inch
Stage Travel: 25 mm (X, Y), 10 mm (Z), 360° (coarse rotation), 15° (fine rotation)
Substrate Size: 5 mm to 150 mm diameter
Chuck Type: Vacuum (selectable zones)
Chuck Leakage Current: <75 pA at ± 75 VDC
Probe Type: Tungsten, 20 μm tip diameter
Probe Leakage Current: <100 pA at ± 75 VDC
Camera Sensor: Sony IMX415 (4K, 1/2.8")
Total Magnification: 37x – 309x
SMU Voltage Range: ±10 V
SMU Current Range: 10 nA to 200 mA
Vacuum Pump Type: Diaphragm (oil-free)

The vacuum pump is intended for air and non-flammable, non-corrosive dry gases only (e.g. nitrogen, argon), and its exhaust should carry clean gas only, with no liquids or gases that need recovery. Keep the shutter/trigger BNC at 5 V, as higher voltages may damage the port.

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