• Sistem Probe Ossila T2001A4-P2010B1 (System Four Point Probe Original Both Head) - AMI Scientific
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Ossila

Ossila Four Point Probe Original Sha-tipped probe head T2001B4

Ossila Four Point Probe Original Sha-tipped probe head T2001B4
Rp 104.611.500,00
Rp 104.611.500,00
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The Ossila Four-Point Probe Original (T2001B4) with a sharp-tipped probe head is a bench system for measuring sheet resistance, resistivity and conductivity of thin films within seconds. It covers sheet resistances from 100 mΩ/sq to 10 MΩ/sq, with currents from 1 μA to 200 mA and voltages from 100 μV to 10 V.

The sharp-tipped head suits hard materials that naturally grow insulating oxide layers, such as silicon. Its nickel-plated tungsten carbide probes have a tip diameter of 0.08 mm and can apply a maximum force of 197.43 gf, breaking through the oxide to contact the material directly. Probe spacing is 1.6 mm (0.063").

The Original model is operated from a PC using the free Ossila Sheet Resistance Lite software, which calculates geometrical correction factors, derives resistivity and conductivity from sample dimensions and exports data as .csv files. Positive and negative polarity measurements remove voltage offsets, while micrometer height control and a non-slip stage help achieve good electrical contact every time.

Related products

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  • Evaluation of conductive coatings such as indium tin oxide through sheet resistance measurement.
  • Routine electrical characterization of circular or rectangular samples up to 152.4 mm.

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  • Product code: T2001B4
  • Probe type: Sharp-tipped, nickel-plated tungsten carbide
  • Tip diameter: 0.08 mm
  • Maximum probe force: 197.43 gf
  • Probe spacing: 1.6 mm (0.063")
  • Sheet resistance range: 100 mΩ/sq – 10 MΩ/sq
  • Applied voltage range: ±10 mV – ±10 V
  • Voltage measurement precision: ±333 μV
  • Current measurement ranges: ±20 μA – ±200 mA (5 ranges)
  • Rectangular sample size: Long edge minimum: 6 mm (0.24"); Short edge maximum: 152.4 mm (6")
  • Circular sample diameter: 6 mm – 152.4 mm (0.24" – 6.00")
  • Maximum sample thickness: 5 mm (0.2")
  • Dimensions (W x H x D): 145 mm x 150 mm x 240 mm (5.71" x 5.91" x 9.45")
  • Software: Ossila Sheet Resistance Lite (Windows 11, 64-bit)
  • Connectivity: USB 2.0, or Ethernet (requires DHCP)

Use of the sharp-tipped probe head requires screen firmware version 1.1.0 or newer on the instrument. The probe head can add up to 4% additional measurement error, which should be considered when evaluating results.

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