• Sistem Probe Ossila T2001A4-P2010B1 (System Four Point Probe Original Both Head) - AMI Scientific
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Ossila

Ossila Four Point Probe Original Both probe head T2001A4-P2010B1

Ossila Four Point Probe Original Both probe head T2001A4-P2010B1
Rp 109.842.600,00
Rp 109.842.600,00
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The Ossila Four-Point Probe Original (T2001A4-P2010B1) is a bench system for measuring the sheet resistance, resistivity and conductivity of thin films. This configuration comes with both probe heads, one soft-tipped and one sharp-tipped, so a single instrument can handle delicate coatings as well as hard materials such as silicon. The Original model is operated from a PC running the free Ossila Sheet Resistance Lite software.

The soft-tipped head uses rounded, spring-loaded, gold-plated contacts that apply a uniform 60 grams of force, which suits organic materials and very thin films. The sharp-tipped head has nickel-plated tungsten carbide probes that break through native insulating oxide layers with a maximum force of 197.43 gf. Switching between the heads lets you match the contact to each sample.

The system covers sheet resistances from 100 mΩ/sq to 10 MΩ/sq. Positive and negative polarity measurements remove voltage offsets, while micrometer height control and a non-slip stage help achieve good electrical contact. The software calculates geometrical correction factors and saves results as .csv files for further analysis.

Related products

  • Measuring the sheet resistance of thin-film coatings such as indium tin oxide.
  • Characterising delicate organic films or very thin layers with the soft-tipped probe head.
  • Testing silicon and other materials with native oxide layers using the sharp-tipped probe head.
  • Calculating resistivity and conductivity of samples from sheet resistance and entered thickness.
  • Logging measurement data to .csv files for import into analysis software.

Brand Ossila
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  • Product code: T2001A4-P2010B1
  • Sheet Resistance Range: 100 mΩ/sq – 10 MΩ/sq
  • Applied Voltage Range: ±10 mV – ±10 V
  • Voltage Measurement Precision: ±333 μV
  • Current Measurement Ranges: ±20 μA – ±200 mA (5 ranges)
  • Dimensions (W x H x D): 145 mm x 150 mm x 240 mm
  • Probe Heads Included: 1 x Soft-tipped probe head & 1 x Sharp-tipped probe head
  • Soft-Tipped Probes: Rounded, spring-loaded, gold-plated; 0.24 mm radius; 60 grams force
  • Sharp-Tipped Probes: Nickel-plated tungsten carbide; 0.08 mm tip diameter; max force 197.43 gf
  • Probe Spacing (Soft / Sharp): 1.27 mm / 1.6 mm
  • Circular Sample Diameter (Soft / Sharp): 5 mm – 152.4 mm / 6 mm – 152.4 mm
  • Maximum Sample Thickness (Soft / Sharp): 8 mm / 5 mm
  • Software: Ossila Sheet Resistance Lite (Windows 11, 64-bit)
  • Connectivity: USB 2.0, or Ethernet (requires DHCP)

The gold plating on the soft-tipped probes can degrade in humid environments or with corrosive, abrasive or acidic samples, particularly under electrical load. Gold may also diffuse into copper, aluminium, tin and silicon, especially at high temperatures caused by resistive heating at high current. Use the sharp-tipped head for silicon and other oxide-forming materials.

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