• Sistem Probe Ossila T2001A5-P2010B1 (System Four Point Probe Plus Both Head) - AMI Scientific
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Ossila

Ossila Four Point Probe Plus Both probe head T2001A5-P2010B1

Ossila Four Point Probe Plus Both probe head T2001A5-P2010B1
Rp 130.764.900,00
Rp 130.764.900,00
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The Ossila Four-Point Probe Plus is a benchtop instrument for determining the sheet resistance, resistivity and conductivity of thin films within seconds. This configuration ships with two interchangeable probe heads, one soft-tipped and one sharp-tipped, so a single system can handle both delicate and hard samples across a sheet resistance range of 100 mΩ/sq to 10 MΩ/sq.

The soft-tipped head uses rounded, gold-plated, spring-loaded pins that apply a uniform 60 grams of force, protecting organic materials and very thin films. The sharp-tipped head uses nickel-plated tungsten carbide pins that can apply up to 197.43 gf to break through native oxide layers on materials such as silicon.

The Plus model has a built-in display, letting users measure at the press of a button without a PC, which suits glove box work. It can also be run from a PC with the free Ossila Sheet Resistance Lite software, which exports .csv data and calculates geometric correction factors. Positive and negative polarity measurements, micrometer height control and a non-slip stage support accurate, repeatable contact.

Related products

  • Measuring sheet resistance of thin films from 100 mΩ/sq to 10 MΩ/sq.
  • Characterizing delicate organic or very thin films with the soft-tipped probe head.
  • Measuring silicon and other materials with insulating oxide layers using the sharp-tipped probe head.
  • Standalone measurements inside a glove box using the built-in display.
  • Calculating resistivity and conductivity of coatings from sheet resistance and sample thickness.
  • Studying sheet resistance changes in coatings such as indium tin oxide.

Brand Ossila
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  • Product code: T2001A5-P2010B1
  • Sheet Resistance Range: 100 mΩ/sq – 10 MΩ/sq
  • Applied Voltage Range: ±10 mV – ±10 V
  • Voltage Measurement Precision: ±333 μV
  • Current Measurement Ranges: ±20 μA – ±200 mA (5 ranges)
  • Dimensions (W x H x D): 145 mm x 150 mm x 240 mm
  • Included Probe Heads: 1 x Soft-tipped probe head & 1 x Sharp-tipped probe head
  • Soft-tipped Probes: Rounded, gold-plated, spring-loaded; 60 grams force; tip radius 0.24 mm
  • Sharp-tipped Probes: Nickel-plated tungsten carbide; max force 197.43 gf; tip diameter 0.08 mm
  • Probe Spacing (soft / sharp): 1.27 mm / 1.6 mm
  • Circular Sample Diameter (soft / sharp): 5 mm – 152.4 mm / 6 mm – 152.4 mm
  • Maximum Sample Thickness (soft / sharp): 8 mm / 5 mm
  • Software: Ossila Sheet Resistance Lite (Windows 11, 64-bit)
  • Connectivity: USB 2.0, or Ethernet (requires DHCP)

The gold plating on the soft-tipped probes can degrade in humid environments or with corrosive, abrasive or acidic samples, especially under electrical load. Gold may also diffuse into copper, aluminium, tin and silicon, particularly at high temperatures caused by resistive heating at high current. Soft-tipped probes are not suitable for silicon or other materials that form insulating oxide layers. The sharp-tipped head requires screen firmware version 1.1.0 or newer.

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